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Electromigration in ULSI Interconnections
Electromigration in ULSI Interconnections/ Cher Ming Tan. -- Hackensack, NJ: World Scientific, 2010. Call no. : 621.31 T161 Summary:Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner and advanced readers on electromigration in ULSI interconnections. It begins with the basic knowledge required for a detailed study on electromigration,...
17 p hcmute 06/09/2024 163 0
Từ khóa: Electrodiffusion, Integrated circuits -- Ultra large scale integration