- Bạn vui lòng tham khảo Thỏa Thuận Sử Dụng của Thư Viện Số
Tài liệu Thư viện số
Danh mục TaiLieu.VN
This paper will present the technique combining the X-ray diffraction with layer removal method to study of the strain and residual stress distribution in the thickness direction on JIS S45C quenched specimen. The result of the strain and residual stress distribution through the thickness direction are determined, in which the residual stress distribution is the inhomogeneous
7 p hcmute 04/06/2018 334 4
Từ khóa: Strain, Residual stress, X-ray diffraction, Layer removal method.