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Study of Strain and Residual Stress Distribution in the Thickness Direction by Layer Removal Method and X-ray Diffraction

This paper will present the technique combining the X-ray diffraction with layer removal method to study of the strain and residual stress distribution in the thickness direction on JIS S45C quenched specimen. The result of the strain and residual stress distribution through the thickness direction are determined, in which the residual stress distribution is the inhomogeneous

Từ khóa: Strain, Residual stress, X-ray diffraction, Layer removal method.

7 p ovanketv 04/06/2018 334 4

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